Nanoindentatore e nanoscratch, indentatore Berkovich, dotato si due teste di misura, XP (high-resolution) e DCM-II (ultra-high-resolution).
TEsta XP: carico applicato 0-500 mN, risoluzione di spostamento 0.0002 nm, risoluzione si forza 50 nN.

Testa DCM-II: carico applicato 0-500 mN, risoluzione di spostamento <0.01nm, risoluzione si forza 3 nN.

Acquisizione continua  e controreazionata di forza e affondamento, misura continua della rigidezza di contatto, tavola motorizzata xy, stage piezoelettrico per il nano-posizionamento e per la ricostruzione tridimensionale delle impronte).

Realizzazione di prove quasi-statiche e dinamiche in modalità Continuous Stiffness Measurement.
Difference between DCM II and XP head:  
displacement resolution: DCM II 0.0002 nm, XP 0.01 nm;

 
maximum indentation depth: DCM II > 15  μm, XP 1.5 mm (total indenter travel);

maximum load: DCM II 30 mN, XP 500 mN;

 

load resolution: DCM II 3 nN, XP 50 nN.

Nano Indenter G200 system represents the market’s most advanced platform for exploring small-scale material behavior. In addition to incorporating the latest technologies for sample positioning, data acquisition and control conforms to ISO 14577-1, 2 & 3. Through its design and the control it affords you as the user, the Nano Indenter G200 system provides a fast and reliable way to acquire mechanical properties data. While the Nano Indenter G200 system is a flagship instrument for performing nanoindentation experiments, its capabilities extend to other modes of testing; such as mechanical probing, scratch testing and nanomechanical microscopy. With a Nano Indenter G200 system you can perform a variety of different tests; all with unparalleled levels of control. All measurements made in instrumented indentation testing are derived from the fundamental force and displacement data. Incorporating electromagnetic actuation-based force transducers, the Nano Indenter G200 system offers outstanding precision in force application. Current passing through the coil drives the indenter shaft downward while a capacitance gauge measures displacement. Dual leaf springs, separate from the capacitance gauge, hold the indenter column stable and eliminate the possibility of lateral excursions. These advantages in design enable the Nano Indenter G200 system to deliver supreme accuracy and repeatability of calculated properties.
When configured with two force transducers and a high load device, the Nano Indenter G200 system is capable of applying forces that range from a few microNewtons up to 10 N. The Nano Indenter G200 system may also be used in either quasistatic or dynamic mode. Quasi-static mode calculates properties at the maximum penetration depth, delivering a single value for stiffness. In dynamic mode, the patented Continuous Stiffness Measurement (CSM) technique is applied to record stiffness data along with load and displacement data as a continuous function of depth. With the CSM technique, hardness and Young’s modulus may be calculated at every data point acquired during the experiment. Such capabilities offer valuable information for test samples such as thin films, coatings and other surface treatments. Nano Indenter systems from Agilent are the only testing platforms to offer a patented technique for dynamic testing at this scale, and they make the process easy. Users need to make only two decisions: where to place the tests and what experiments to perform at those positions. Our industry-leading TestWorks® 4 software automates the testing process while the Analyst™ accuracy, the new Nano Indenter G200 is the fastest, most nanomechanical testing. package performs data reduction and organizes the storage of test data for easy retrieval. Both come standard with all
systems from Agilent.

• Two heads available in our system: XP and DCM-II.

• Excellent positional accuracy - 2 nm with the nano-positioning stage

• Lateral force measurement

• Continous stiffness measurement (CSM)
• Maximum indetation depth >500 µm
• Easy viewing of sample position and sample work area
• ISO 14577 conformance ensures data integrity

Available testing modes:
• Quasi-static and dynamic nanoindentation
• Mechanical probing
• Scratch testing and coefficient of friction measurement
• Nanomechanical microscopy