Title: "High resolution morphological and mechanical characterization of Niobium films obtained by MS and Biased MS PVD " Authors: BEMPORAD E. anD SEBASTIANI M. anD CARASSITI F. Published in: The International Workshop on: Thin Films and new ideas for pushing the limits of RF superconductivity October 9-12, 2006 Padova Volume #: - Pages: - Pub Year: 2006 ISSN: DOI: Publication Type: oral contribution at a conference