Title: "Residual stress measurement at the micrometre scale: Focused Ion Beam (FIB) milling and nanoindentation testing" Authors: Sebastiani M. and Bemporad E. and Carassiti F. and Schwarzer N. Published in: Nanomechanical Testing in Materials Research and Development Volume #: - Pages: - Pub Year: 2009 ISSN: DOI: Publication Type: oral contribution at a conference