Title: "Residual stress measurement at the micrometer scale: focused ion beam (FIB) milling and nanoindentation testing" Authors: Sebastiani M. and Bemporad E. and Schwarzer N. and Carassiti F. Published in: Philosophical Magazine: Structure and Properties of Condensed Matter Volume #: 91 (7) Pages: 1121-1136 Pub Year: 2011 ISSN: 1478-6435 DOI: http://10.1080/14786431003800883, http://10.1080/14786431003800883 Publication Type: paper in a journal