Title: "Focused Ion Beam and Nano-Mechanical Tests for High-Resolution Surface Characterization: Not So Far Away from Jewelry Manufacturing" Authors: Bemporad E. and Sebastiani M. Published in: Proceedings of the 24th Santa Fe Symposium in Albuquerque, New Mexico, 16-19 May 2010 Volume #: - Pages: 51-78 Pub Year: 2010 ISSN: 978-0-931913-40-2 DOI: Publication Type: paper in conference proceedings