Title: "Focused Ion Beam and Nano-Mechanical Tests for High-Resolution Surface Characterization: Not So Far Away from Jewelry Manufacturing " Authors: Bemporad E., Sebastiani M. and Carassiti F. Published in: 24th Santa Fe Symposium on Jewelry manufacturing Technology 2010 in Albuquerque, New Mexico, 16-19 May 2010 Volume #: - Pages: 51-78 Pub Year: 2010 ISSN: DOI: Publication Type: oral contribution at a conference