Title: "Residual Stress Evaluation at the Micrometer Scale: Analysis of Thin Coatings by FIB milling and Digital Image Correlation" Authors: A. M. Korsunsky, M. Sebastiani, E. Bemporad Published in: Surface and Coatings Technology Volume #: 205 Pages: 2393-2403 Pub Year: 2010 ISSN: 0257-8972 DOI: http://10.1016/j.surfcoat.2010.09.033, http://10.1016/j.surfcoat.2010.09.033 Publication Type: paper in a journal