Title: "Focused ion beam and nanomechanical testing for high resolution materials characterization" Authors: M. Sebastiani, E. Bemporad, F. Carassiti Published in: TENTH ANNUAL MICRO MATERIALS EUROPEAN USER MEETING - Politecnico di Milano, Milano - 28.10.2010 Volume #: - Pages: - Pub Year: 2010 ISSN: DOI: Publication Type: oral contribution at a conference