Title: "FOCUSSED ION BEAM AND NANO MECHANICAL TESTS FOR HIGH RESOLUTION SURFACE CHARACTERISATION" Authors: E. Bemporad Published in: VIII Coinvegno INSTM sulla Scienza e Tecnologia dei Materiali, Aci Castello (CT) 26-29 Giugno 2011 Volume #: - Pages: - Pub Year: 2011 ISSN: DOI: Publication Type: oral contribution at a conference