Title: "Residual Stress Measurements at the Micrometric Scale: Focused Ion Beam (FIB) Milling and Nanoindentation Testing for Site-Specific Residual Stress" Authors: Sebastiani M., Bemporad E., Carassiti F., Schwarzer N. Published in: VII Convegno INSTM sulla Scienza e Tecnologia dei Materiali, Tirrenia 9-12 giugno 2009 Volume #: VII Pages: CO07 Pub Year: 2009 ISSN: DOI: Publication Type: paper in conference proceedings