Title: "Focused ion beam and nanomechanical testing for high resolution materials chacarterizzation" Authors: Sebastiani, M., Bemporad E., Carassiti F. Published in: 10th Annual Micro Materials European User Meeting 27-28th Oct 2010, Politecnico Milano - Delegate Handbook Volume #: - Pages: n.a. Pub Year: 2010 ISSN: DOI: Publication Type: paper in conference proceedings