Title: "Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale" Authors: M. SEBASTIANI, C. Eberl, E. Bemporad, A. M. Korsunsky, W. D. Nix, F. Carassiti Published in: Surface and Coatings Technology Volume #: 251 Pages: 151–161 Pub Year: 2014 ISSN: DOI: http://dx.doi.org/10.1016/j.surfcoat.2014.04.019, http://dx.doi.org/10.1016/j.surfcoat.2014.04.019 Publication Type: paper in a journal