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| FEI Helios NanoLab™ 600 |  | What puts the Helios NanoLab in a class of its own is its ability to offer the highest imaging, contrast, stability and speed performance together with the largest range of SEM / FIB applications. It ensures best resolution, reproducible metrology and best control of the beam for writing purposes. The outstanding imaging capabilities of the Helios NanoLab start with its novel FESEM tec
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| Transmission electron Microscope | .jpg) | FEI CM 120 EDS Edax DX-4
120kV, analytical with LaB6 filament, sample holder with 5 axes motorized. Linear resolution of 0.2nm. EDS probe with range of detectable elements since borum, resolution MnKa 134eV, digital acquisition of rX compositional profile and maps.Software for quantitative-semiquantitative analysis using ZAF and PhiRhoZ models.TEM CCD: Effecti
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| Bruker D8 Discover DaVinci Xray Diffractometer |  | The D8 Discover is an all purpose X-ray analyzer which can be configured for a great range of diffraction applications: powder diffraction, including phase identification and quantitative phase analysis, micro-structure and crystal structure analysis, film analysis, residual stress and texture investigations. This device can therefore be used for many purposes, such as studying the crystal struct
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| Agilent NANO Indenter® G200 |  | Nano Indenter G200 system represents the market’s most advanced platform for exploring small-scale material behavior. In addition to incorporating the latest technologies for sample positioning, data acquisition and control conforms to ISO 14577-1, 2 & 3. Through its design and the control it affords you as the user, the Nano Indenter G200 system provides a fast and reliable way to acqui
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| Scanning electron Microscope |  | SEM stands for scanning electron microscope. The SEM is a microscope that uses electrons instead of light to form an image. The scanning electron microscope has many advantages over traditional microscopes. The SEM has a large depth of field, which allows more of a specimen to be in focus at one time. The SEM also has much higher resolution, so closely spaced specimens can be magnified at much
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| TEM sample preparation line |  | TEM sample preparation is a line of instruments for cut and polish a sample to reduce his thickness up to electron transparency (about 100nm). The sample is preliminarly cut to a disk shape using an ultrasonic driller and then thinned using a sequence of diamond papers. The final step is prformed using an electropolisher or ion milling. |
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| confocal/interferometric 3D profilometer |  | Micro optical measurement technology fulfils two important requirements of metrology: non-destructive measurementcombined with high accuracy. The measuring capabilities of the Leica DCM 3D range from a few nanometers to severalmillimeters and therefore serving a wide variety of different applications. Besides the capabilities of adapting to therequirements of the applicatio
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| SEM sample preparation line |  | |
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| iNano by nanomechanics |  | The iNano™ nanoindenter is made easy and affordable by offering repeatability,accuracy and precision. iNano by Nanomechanics, Inc. brings cutting edge technology to research labs across the world in a user-friendly, small footprint, dynamic package that can have you running precise experiments with highly accurate data in less than 2 hours. Every element of the iNano is designed to pro
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| Atomic Force Microscope |  | Atomic Force Microscope (NT-MDT, contact, semi-contact, lateral force and other modes of measure), scanning area 100x100 µm2).Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
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| InSEM Microprobe nanoindenter |  | The InSEM is a tool for characterizing the mechanical properties of surfaces or structures, which is designed to function with sub-nanometer resolution in an in-situ vacuum environment such as an SEM or FIB.The InSEM is designed to seamlessly integrate high-resolution mechanical testing capabilities into SEM or FIB. The InSEM is designed to be modular and flexible, to enable a wide range of
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| Optical Microscopy |  | The optical microscope, often referred to as the "light microscope", is a type of microscope which uses visible light and a system of lenses to magnify images of small samples. Optical microscopes are the oldest design of microscope and were possibly designed in their present compound form in the 17th century
The image from an optical microscope can be captured by norma
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| Xray Fluorescence Spectroscopy |  | XRF stands for X-Ray Fluorescence. An X-ray tube sends a beam on a specimen. The atoms of the specimen absorb the X-rays and then reemission occours. Analyzing the energy of the emitted X-rays from the sample is possible to asses witch kind of elements are presents, and the amount |
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| MS-PVD |  | This is a reactive magnetron sputtering based on two balanced magnetron cathode powered by DC generator and a RF bias system for the substrate.
This equipment allows to obtain a multilayer thin coating in reactive atmosphere. |
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| Diaptometer |  | It is an instrument that measures the fundamental mechanical properties, within the engineering stress-strain σ-ε curve, as the yield strength and the ultimate tensile strength (maximum stress before necking), with a non-destructive and practical approach. |
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| CSM REVETEST® Scratch Testing instrument |  | The REVETEST® Scratch Testing instrument is globally regarded as the ideal system for characterizing hard-coated materials, with a typical coating thickness of various microns. Coatings may be organic or inorganic, covering Tribological, magnetic and decorative applications, such as PVD, CVD, PECVD, metallization and passivation layers, wear and friction protective coatings. Substrates
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| Hardness Tester | .jpg) | Mitutoyo HM124
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| CAM Contact Angle Measurement Instrument - Goniometer |  | Contact angle measurement (CA) is a simple-to-adopt method for surface analysis related to surface energy and tension; Contact ancgle describes the shape of a liquid droplet resting on a solid surface. When drawing a tangent line from the droplet to the touch of the solid surface, the contact angle is the angle between the tangent line and the solid surface.
If a liquid with well
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| Dry corrosion Cabinet |  | The salt spray test is a standardized test method used to check corrosion resistance of coated samples. Salt spray test is an accelerated corrosion test that produces a corrosive attack to the coated samples in order to predict its suitability in use as a protective finish. The appearance of corrosion products (oxides) is evaluated after a period of time. Test duration depends on
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| Complex wear system tribometer |  | A prototype for surface degradation measurement on micrometric and submicrometric scale for the tribological studies of the surfaces.The tribometer allows to calculate the instantaneous Archard's wear coefficient for bulk and coated samples. It quantitatively asses the value of friction coefficient for the coupling between the part and the counterpart, in the range of motion conditions
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| Universal Hardness Tester |  | There are three types of tests that can be applied by this instrument; they are the Brinell hardness test, the Rockwell hardness test, and the Vickers hardness test. Since the definitions of metallurgic ultimate strength and hardness are rather similar, it can generally be assumed that a strong metal is also a hard metal. The way the three of these hardness tests measure a metal's hardness i
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| PYRO - Flame Treatment |  | The instrument allows to perform cleaning treatments on organic and inorganic surfaces. In particular, it allows to perform both morphological and chemical modification on polymeric surfaces. The chemical activation is obtained through the insertion of functional groups containing oxygen (carbonyls, carboxyls, hydroxyls, etc…) which are present inside the flame.With this treatment it i
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| video boroscope |  | A borescope is an optical device consisting of a rigid or flexible tube with an eyepiece on one end, an objective lens on the other linked together by a relay optical system in between. The optical system is usually surrounded by optical fibers used for illumination of the remote object. An internal image of the illuminated object is formed by the objective lens and magnified by the eyepiece
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| Durometer Shore D |  | There are several scales of durometer, used for materials with different properties. The two most common scales, using slightly different measurement systems, are type A and type D scales according to the ISO 21509 and ISO 868 standards. The A scale is used for softer plastics, while the D scale is used for harder ones. |
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